S3C2410
所属分类：嵌入式/单片机/硬件编程
开发工具：C/C++
文件大小：794KB
下载次数：14
上传日期：2010-01-17 22:29:02
上 传 者：
2082194
说明： 这是嵌入式课程的基础实验，芯片是三星的S3C2410，里面附有详细的注释，值得初学者学习
(This is a curriculum-based embedded test, the chip is a Samsung S3C2410, which with detailed annotations, it is worth learning for beginners)
文件列表:
一.基本IO口实验\4.2_led_test\led_test.c (3383, 2010-01-14)
一.基本IO口实验\4.2_led_test\led_test.Opt (2371, 2010-01-15)
一.基本IO口实验\4.2_led_test\led_test.plg (167, 2008-02-26)
一.基本IO口实验\4.2_led_test\led_test.Uv2 (2819, 2008-03-04)
一.基本IO口实验\4.2_led_test\led_test_led_test.dep (2653, 2010-01-15)
一.基本IO口实验\4.2_led_test\led_test_Opt.Bak (2231, 2010-01-15)
一.基本IO口实验\4.2_led_test\led_test_Target 1.dep (2691, 2008-02-26)
一.基本IO口实验\4.2_led_test\led_test_Uv2.Bak (2713, 2008-02-26)
一.基本IO口实验\4.2_led_test\list\led_test.map (89918, 2010-01-14)
一.基本IO口实验\4.2_led_test\list\S3C2410A.lst (135289, 2010-01-14)
一.基本IO口实验\4.2_led_test\main.c (1119, 2008-02-26)
一.基本IO口实验\4.2_led_test\obj\2410lib.crf (34368, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\2410lib.d (571, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\2410lib.o (51132, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\led_test.axf (48836, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\led_test.crf (18704, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\led_test.d (284, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\led_test.htm (67943, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\led_test.lnp (349, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\led_test.o (33348, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\led_test.plg (213, 2010-01-15)
一.基本IO口实验\4.2_led_test\obj\led_test.tra (1191, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\main.crf (18371, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\main.d (252, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\main.o (31988, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\S3C2410A.o (3576, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\sys_init.crf (26574, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\sys_init.d (492, 2010-01-14)
一.基本IO口实验\4.2_led_test\obj\sys_init.o (40932, 2010-01-14)
一.基本IO口实验\common\DebugInRam.ini (266, 2007-10-19)
一.基本IO口实验\common\inc\2410addr.h (35952, 2008-03-03)
一.基本IO口实验\common\inc\2410addr.s (24589, 2007-10-19)
一.基本IO口实验\common\inc\2410lib.h (2826, 2008-03-04)
一.基本IO口实验\common\inc\2410slib.h (3645, 2007-10-19)
一.基本IO口实验\common\inc\2410swis.h (440, 2007-10-19)
一.基本IO口实验\common\inc\def.h (873, 2008-03-03)
一.基本IO口实验\common\inc\memcfg.h (3339, 2007-10-19)
一.基本IO口实验\common\inc\Memcfg.s (2962, 2007-10-19)
一.基本IO口实验\common\inc\mmu.h (3845, 2007-10-19)
... ...
程序正确运行后，会在超级终端上输出如下信息:
External Interrupt Test Example
boot success...
Embest Arm S3CEB2410 Evaluation Board
External Interrupt Test Example
1.L-LEVEL 2.H-LEVEL 3.F-EDGE(default here) 4.R-EDGE 5.B-EDGE
Select number to change the external interrupt type:
Press SPACE(PC) to exit...
g
在PC机键盘上输入3选择下降沿触发，并按下按钮SB301
3.F-EDGE
EINT0 interrupt occurred.
按下SB303键，超级终端主窗口中继续显示：
EINT11 interrupt occurred.
按下SB303键，超级终端主窗口中继续显示：
EINT19 interrupt occurred.
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