AD_TEST
所属分类：其他嵌入式/单片机内容
开发工具：C/C++
文件大小：36KB
下载次数：8
上传日期：2011-04-07 17:30:31
上 传 者：
cisca
说明： 本文件是AD测试实验；测试前需要对管脚复用的电压基准进行设置，将JP10的2，3脚短接，1脚空出。AD输入端子(J10)可输入4路AD(ADC0--ADC3)，另有1路可测量片内温度，5路采样值都通过串口发送出去，在串口调试助手上看观察其值。4路AD中ADC0可通过跳线器(JP5)“ADJ_VOL”（1，2脚短接）与板上电位器相连，通过手动调VR1可以观察到电压值的变化
(This document is the AD test experiment testing is required before reuse of the voltage reference pin is set, the JP10 shorted 2,3 feet, 1 foot empty. AD input terminals (J10) to enter 4 AD (ADC0- ADC3), and 1 way to measure chip temperature, 5-way samples are sent through the serial port, serial port debugging assistant in terms of observed values. 4 AD by the ADC0 jumper (JP5) " ADJ_VOL" (1,2 pin shorted) is connected with the on-board potentiometer, VR1 can be observed by manually adjusting the voltage changes)
文件列表:
AD_TEST\ADC.c (738, 2010-07-21)
AD_TEST\ADC.h (31, 2010-07-21)
AD_TEST\ADC.LST (1943, 2010-07-21)
AD_TEST\ADC.OBJ (2020, 2010-07-21)
AD_TEST\ADTEST (18901, 2010-07-21)
AD_TEST\ADTEST.hex (9855, 2010-07-21)
AD_TEST\ADTEST.lnp (81, 2010-07-21)
AD_TEST\ADTEST.M51 (19523, 2010-07-21)
AD_TEST\ADTEST.Opt (1748, 2011-01-19)
AD_TEST\ADTEST.plg (204, 2011-01-19)
AD_TEST\ADTEST.Uv2 (2267, 2010-10-11)
AD_TEST\ADTEST_Opt.Bak (1740, 2010-10-11)
AD_TEST\ADTEST_Uv2.Bak (2148, 2010-07-21)
AD_TEST\c8051F320.h (16719, 2010-07-21)
AD_TEST\ML-320.c (2790, 2010-07-21)
AD_TEST\ML-320.h (125, 2010-07-21)
AD_TEST\ML-320.LST (6016, 2010-07-21)
AD_TEST\ML-320.OBJ (9029, 2010-07-21)
AD_TEST\SPI.c (985, 2010-07-21)
AD_TEST\SPI.h (93, 2010-07-21)
AD_TEST\SPI.LST (2523, 2010-07-21)
AD_TEST\SPI.OBJ (2924, 2010-07-21)
AD_TEST\Uart.c (1550, 2010-07-21)
AD_TEST\Uart.h (257, 2010-07-21)
AD_TEST\Uart.LST (3295, 2010-07-21)
AD_TEST\Uart.OBJ (3774, 2010-07-21)
AD_TEST (0, 2011-01-19)
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