说明：  码密度法测试ADC的DNL和INL，可用于逐次逼近型和流水线型ADC。
(v1=v1'; code=v1(:,2); code_count=zeros(1,2^numbit); %Code count for i=1:size(code), code_count(code(i)+1)=code_count(code(i)+1) + 1; end %Routine to detect whether the ADC's input is clipping or not if code_count(1) == 0 | code_count(2^numbit) == 0 | ... (code_count(1) < code_count(2)) | (code_count(2^numbit-1) > code_count(2^numbit)) disp('Increase Sine-Wave Amplitude to Slightly Clip the ADC!!!'); break; end)