wafer-defect-classification-using-deep-learining
所属分类：人工智能/神经网络/深度学习
开发工具：Jupyter Notebook
文件大小：0KB
下载次数：1
上传日期：2024-01-11 14:58:45
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sh-1993
说明： 基于研究论文《晶圆缺陷识别的深度卷积神经网络》，提出了一种半导体晶圆缺陷分类代码…
(A code to classify defects on semi-conductor wafers, based on the research paper "A Deep Convolutional Neural Network for Wafer Defect Id…)
文件列表:
Project_presentation.pptx
wafer_defect_classification_by_deep_learning.ipynb
# wafer-defect-classification-using-deep-learining
A code to classify defects on semi-conductor wafers, based on the research paper "A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes", IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 33, NO. 3, AUGUST 2020
https://www.researchgate.net/publication/341361160_A_Deep_Convolutional_Neural_Network_for_Wafer_Defect_Identification_on_an_Imbalanced_Dataset_in_Semiconductor_Manufacturing_Processes
# Dataset-Used
WM-811K dataset which consists of 811,457 real wafer images from semiconductor fabrication.
link to the dataset: https://www.kaggle.com/datasets/qingyi/wm811k-wafer-map
# Further information on the project
link to PPT: https://smailiitmacin-my.sharepoint.com/:p:/g/personal/me20b167_smail_iitm_ac_in/EYyzejBhSQVApUz-m1LStNcBHqxFfF6_kAm0KC_6UE1TOw?e=c4o8AT
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