文件列表:

NAND_IO_x16.h (6136, 2006-06-15)
NAND_LLD_x16.h (2676, 2006-06-15)
NAND_IO_TEST_X16.c (25344, 2006-06-14)
NAND_IO_x16.c (49331, 2006-06-15)

Readme.txt Disclaimer of Warranty: ----------------------- This software code and all associated documentation, comments or other information (collectively "Software") is provided "AS IS" without warranty of any kind. MICRON TECHNOLOGY, INC. ("MTI") EXPRESSLY DISCLAIMS ALL WARRANTIES EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO, NONINFRINGEMENT OF THIRD PARTY RIGHTS, AND ANY IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR ANY PARTICULAR PURPOSE. MTI DOES NOT WARRANT THAT THE SOFTWARE WILL MEET YOUR REQUIREMENTS, OR THAT THE OPERATION OF THE SOFTWARE WILL BE UNINTERRUPTED OR ERROR-FREE. FURTHERMORE, MTI DOES NOT MAKE ANY REPRESENTATIONS REGARDING THE USE OR THE RESULTS OF THE USE OF THE SOFTWARE IN TERMS OF ITS CORRECTNESS, ACCURACY, RELIABILITY, OR OTHERWISE. THE ENTIRE RISK ARISING OUT OF USE OR PERFORMANCE OF THE SOFTWARE REMAINS WITH YOU. IN NO EVENT SHALL MTI, ITS AFFILIATED COMPANIES OR THEIR SUPPLIERS BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, INCIDENTAL, OR SPECIAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS OF PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF YOUR USE OF OR INABILITY TO USE THE SOFTWARE, EVEN IF MTI HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Because some jurisdictions prohibit the exclusion or limitation of liability for consequential or incidental damages, the above limitation may not apply to you. Copyright 2006 Micron Technology, Inc. All rights reserved. This file contains a summary of the files required for a NAND Flash test application. NAND_IO_Test.c: This file contains source code which provides a real implementation of the NAND_IO drivers. The NAND IO drivers include an implementation of all the data sheet commands for a Micron NAND device including Reset, Read ID, Page Read, Page Program, Cache Program, Cache Read, etc. For additonal details see descriptions below. The source code also shows how to check a Micron NAND flash device for bad blocks, how to create a simple bad block table based on the results of the bad block check, and how to skip operations on bad blocks based on the bad block table. Reset - Issue reset command (0xFF) to NAND device Read ID - Issue Read ID command and display Read ID bytes 0, 1, 2, 3 Read Unique ID - Issue Read Unique ID command and display Unique ID bytes 0 - 15. Read for bad blocks. - This test provides an example for setting up a simple bad block table. Read byte 2048 of page 0 and page 1 of each block. If either of these bytes is non-FF add block to bad block table. Erase all good blocks. - Issue erase command to all good blocks and check Pass/Fail status. Page Program quick test - Program Block 0, page 2 with 0xAA data in all bytes. - Program Block 0, page 3 with 0x55 data in all bytes. Page Read quick test - Read Block 0, page 2 and check for 0xAA data in all bytes. - Read Block 0, page 3 and check for 0x55 data in all bytes. Random Data Program - Program 0x00 to block 0, page 4 bytes 0 - 511 and 2048 - 2063. - Program 0x01 to block 0, page 4 bytes 512 - 1023 and 20*** - 2079. - Program 0x02 to block 0, page 4 bytes 1024 - 1535 and 2080 - 2095. - Program 0x03 to block 0, page 4 bytes 1536 - 2047 and 2096 - 2111. Random Data Read - Read for 0x00 in page 4 bytes 0 - 511 and 2048 - 2063. - Read for 0x01 in page 4 bytes 512 - 1023 and 20*** - 2079. - Read for 0x02 in page 4 bytes 1024 - 1535 and 2080 - 2095. - Read for 0x03 in page 4 bytes 1536 - 2047 and 2096 - 2111. Cache Program - Program 0x55 data to Block 0, Page 5 - 10 all bytes. Cache Read - Read for 0x55 data in Block 0, Page 5 - 10 all bytes. Internal Data Move - Copy Block 0 page 5 - 10 to pages 11 - 16 respectively. - Read back data in pages 11 - 16 to confirm success. Internal Data Move with Random Data Input - Copy Block 0, page 4 to block 0 page 17 and change bytes 512 - 1023 and bytes 20*** - 2090 to 0x00. Page Program long test - For each good block program 0xAA in even pages and 0x55 in odd pages. Page Read long test - For each good block read for 0xAA in even pages and 0x55 in odd pages. Erase all good blocks Page Read, all 0xFF - Check all bytes of all pages of all good blocks for 0xFF data NAND_IO.c This file contains source code for the NAND I/O drivers, which represent the standard command set for Micron NAND flash devices. NAND_IO.h Header file. NAND_LLD.h This is the NAND Low Level Driver Header file. THIS FILE MUST BE MODIFIED BEFORE THE NAND_IO DRIVERS CAN BE RUN ON A SPECIFIC SYSTEM. At a minimum the address Offsets for CLE, ALE, RE, and WE must be changed. Other changes may also be required depending on the hardware of the specific system.

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