说明：  这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。 这篇文章主要是总结了前段时间的一些心得体会，希望对想了解ARM JTAG调试的网友们有所帮助。我个人对ARM JTAG的理解还不是很透彻，在文章中，难免会有偏失和不准确的地方，希望精通JTAG调试原理的大侠们不要拍砖，有什么问题提出来，我一定尽力纠正。同时也欢迎对ARM JTAG调试感兴趣的朋友们一起交流学习。
(This article introduces the ARM JTAG debug the basic principles. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction On this basis, the combination of ARM7TDMI detailed principle of the JTAG debugger. This article mainly summarizes some previous experiences, in the hope that would like to know ARM JTAG debug netizens help. I personally do not understand the ARM JTAG is very thorough, in his article, it is inevitable there will be ignored and inaccurate, hoping the master principle of JTAG debug拍砖heroes will not have any issue, I will certainly make every effort to rectify . At the same time, also welcomed the ARM JTAG debug friends interested in the exchange of learning.)